TY - JOUR AU - Riedo, Andreas AU - Grimaudo, Valentine AU - Moreno-GarcĂ­a, Pavel AU - Neuland, Maike B. AU - Tulej, Marek AU - Broekmann, Peter AU - Wurz, Peter PY - 2016/04/27 Y2 - 2024/03/29 TI - Laser Ablation/Ionisation Mass Spectrometry: Sensitive and Quantitative Chemical Depth Profiling of Solid Materials JF - CHIMIA JA - Chimia VL - 70 IS - 4 SE - Scientific Articles DO - 10.2533/chimia.2016.268 UR - https://www.chimia.ch/chimia/article/view/2016_268 SP - 268 AB - Direct quantitative and sensitive chemical analysis of solid materials with high spatial resolution, both in lateral and vertical direction is of high importance in various fields of analytical research, ranging from in situ space research to the semiconductor industry. Accurate knowledge of the chemical composition of solid materials allows a better understanding of physical and chemical processes that formed/altered the material and allows e.g. to further improve these processes. So far, state-of-the-art techniques such as SIMS, LA-ICP-MS or GD-MS have been applied for chemical analyses in these fields of research. In this report we review the current measurement capability and the applicability of our Laser Ablation/Ionisation Mass Spectrometer (instrument name LMS) for the chemical analysis of solids with high spatial resolution. The most recent chemical analyses conducted on various solid materials, including e.g. alloys, fossils and meteorites are discussed. ER -