RIEDO, Andreas; GRIMAUDO, Valentine; MORENO-GARCÍA, Pavel; NEULAND, Maike B.; TULEJ, Marek; BROEKMANN, Peter; WURZ, Peter. Laser Ablation/Ionisation Mass Spectrometry: Sensitive and Quantitative Chemical Depth Profiling of Solid Materials. CHIMIA, [S. l.], v. 70, n. 4, p. 268, 2016. DOI: 10.2533/chimia.2016.268. Disponível em: https://www.chimia.ch/chimia/article/view/2016_268. Acesso em: 14 apr. 2024.