BAURECHT, Dieter; REITER, Gerald; HASSLER, Norbert; SCHWARZOTT, Michael; FRINGELI, Urs Peter. Application of Special FTIR ATR Techniques for Quantitative Structural Analysis of Thin Surface Layers. CHIMIA, [S. l.], v. 59, n. 5, p. 226, 2005. DOI: 10.2533/000942905777676524. Disponível em: https://www.chimia.ch/chimia/article/view/2005_226. Acesso em: 30 apr. 2024.