NELLEN, Philipp M.; CALLEGARI, Victor; SENNHAUSER, Urs. Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments. CHIMIA, [S. l.], v. 60, n. 11, p. 735, 2006. DOI: 10.2533/chimia.2006.735. Disponível em: https://www.chimia.ch/chimia/article/view/2006_735. Acesso em: 29 apr. 2024.