PHAM, Duc T.; KELLER, Hubert; BREUER, Stephan; HUEMANN, Sascha; HAI, Nguyen T.N.; ZOERLEIN, Caroline; WANDELT, Klaus; BROEKMANN, Peter. Anion/Cation Layers at Electrified Interfaces: A Comprehensive STM, XRD and XPS Case Study. CHIMIA, [S. l.], v. 63, n. 3, p. 115, 2009. DOI: 10.2533/chimia.2009.115. Disponível em: https://www.chimia.ch/chimia/article/view/2009_115. Acesso em: 30 apr. 2024.