MARIN CARBONNE, Johanna; KISS, Andras; BOUVIER, Anne-Sophie; MEIBOM, Anders; BAUMGARTNER, Lukas; BOVAY, Thomas; PLANE, Florent; ESCRIG, Stephane; RUBATTO, Daniela. Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories . CHIMIA, [S. l.], v. 76, n. 1-2, p. 26–33, 2022. DOI: 10.2533/chimia.2022.26. Disponível em: https://www.chimia.ch/chimia/article/view/2022_026. Acesso em: 25 may. 2024.