Entwicklung und neuere Ergebnisse der chemischen Hochauflösungs-Elektronenmikroskopie

Abstract

The consequences of the increasingly better resolving power of transmission electron microscopes on chemical applications are reviewed. Special reference is made to the weak beam technique for the investigation of dislocations, the direct imaging of local structures, atomic resolution in crystal, structure images, pictures of isolated atoms, beam sensitive specimens, elemental analysis in t. e. m., and observation of dynamic processes.